Probes for Handheld Gauges - Fischer Technology Inc. USA

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Probes for Handheld Gauges

0,0 μm - 1000,0 μm

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Active Filter

0,0 μm - 1000,0 μm

Measurement Method

Magnetic Induction (1)

Coating

Ferromagnetic Metals (1)

Probe Design

Single Tip Inside Probe (1)

Measuring Range

0,0 μm - 1000,0 μm (1)

PROBE FAI3.3-150

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Catalog

Probe FGABI1.3-150

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Fischer is a full-range supplier in the field of surface inspection and has been developing precision instruments for surface measurements since 1953.

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Handheld Gauges

DMP® 10 – 40
FERITSCOPE DMP30
SR-SCOPE® DMP®30
MMS Inspection
DUALSCOPE®
DELTASCOPE®
ISOSCOPE®
MP0®, MP0®R

Probes

Probe FTA3.3H
Probe F20H
Probe FS40
Probe FGAB1.3
Probe FKB10
Probe FAW3.3
Probe FD13H

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